The Pull-Off Force and the Work of Adhesion: New Challenges at the Nanoscale

Adhesion at the nanoscale and between MEMS/NEMS components can be unique both physically and in the manner in which it is measured [1]. Unpredictable topographies, size-dependent deformation mechanisms, compliance of surface coatings, and the statistical nature of device/surface fabrication are just...

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Bibliographic Details
Published inAdhesion Aspects in MEMS/NEMS pp. 209 - 222
Format Book Chapter
LanguageEnglish
Published CRC Press 2010
Subjects
Diamond Indenter
Long Range Attraction
Adhesion Aspects
Contact Geometry
Nanoscale Adhesion
Diamond Tip
Tip Sample Separations
Van Der Waals Forces
IFM
Van Der Waals
Viscoelastic Deformation
Adhesion Behavior
Measure Adhesion Forces
DMT Theory
Vinyl Acetate
Scientific Polymer Products
DMT Model
Sandia National Laboratories
Yang Model
Single Asperity Contact
NEMS
Short Range Attraction
True Contact Area
Scanning Probe Microscopies
Integral Method
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Summary:Adhesion at the nanoscale and between MEMS/NEMS components can be unique both physically and in the manner in which it is measured [1]. Unpredictable topographies, size-dependent deformation mechanisms, compliance of surface coatings, and the statistical nature of device/surface fabrication are just a few complexities that lead to a rich diversity of adhesion behavior at the nanoscale [1-8]. An equal challenge is that nanoscale adhesion is often most conveniently measured with scanning probe microscopies, which can measure very small forces, but provide only limited information about the contact geometry [9, 10], thus making difficult the validation of suitable contact mechanics models.
DOI:10.1201/b12181-16