Detecting Rotational Symmetry Under Affine Projection

A new method is presented for detecting planar rotational symmetry under affine projection. The method can deal with partial occlusion and is able to detect multiple rotationally symmetric surfaces in complex backgrounds. The order of rotational symmetry can be estimated, and if it is greater than t...

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Published in18th International Conference on Pattern Recognition (ICPR'06) Vol. 2; pp. 292 - 295
Main Authors Cornelius, H., Loy, G.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2006
SeriesINTERNATIONAL CONFERENCE ON PATTERN RECOGNITION
Subjects
Algorithm design and analysis
Computer vision
Detectors
Fourier transforms
Image segmentation
Manufacturing
Noise robustness
Object detection
Radio access networks
Shape
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Abstract A new method is presented for detecting planar rotational symmetry under affine projection. The method can deal with partial occlusion and is able to detect multiple rotationally symmetric surfaces in complex backgrounds. The order of rotational symmetry can be estimated, and if it is greater than two, the tilt and orientation of the rotationally symmetric surface can be found and the symmetric region segmented. Local features robust to local affine distortion are matched to obtain pairs of features. Each feature pair hypothesis a set of centres of rotation for different tilts and orientations and the centres of rotation that are close to each other are grouped together to find the dominant rotational symmetries in the image. The method is posed independently of a specific feature detector and descriptor. Results are presented on natural images
AbstractList A new method is presented for detecting planar rotational symmetry under affine projection. The method can deal with partial occlusion and is able to detect multiple rotationally symmetric surfaces in complex backgrounds. The order of rotational symmetry can be estimated, and if it is greater than two, the tilt and orientation of the rotationally symmetric surface can be found and the symmetric region segmented. Local features robust to local affine distortion are matched to obtain pairs of features. Each feature pair hypothesis a set of centres of rotation for different tilts and orientations and the centres of rotation that are close to each other are grouped together to find the dominant rotational symmetries in the image. The method is posed independently of a specific feature detector and descriptor. Results are presented on natural images
A new method is presented for detecting planar rotational symmetry under affine projection. The method can deal with partial occlusion and is able to detect multiple rotationally symmetric surfaces in complex backgrounds. The order of rotational symmetry can be estimated, and if it is greater than two, the tilt and orientation of the rotationally symmetric surface can be found and the symmetric region segmented. Local features robust to local affine distortion are matched to obtain pairs of features. Each feature pair hypothesises a set of centres of rotation for different tilts and orientations and the centres of rotation that are close to each other are grouped together to find the dominant rotational symmetries in the image. The method is posed independently of a specific feature detector and descriptor Results are presented on natural images.
Author Loy, G.
Cornelius, H.
Author_xml – sequence: 1
  givenname: H.
  surname: Cornelius
  fullname: Cornelius, H.
  organization: R. Inst. of Technol., Stockholm
– sequence: 2
  givenname: G.
  surname: Loy
  fullname: Loy, G.
  organization: R. Inst. of Technol., Stockholm
BackLink https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-42034$$DView record from Swedish Publication Index
BookMark eNo9zM1OwkAUBeCJYiIgS1du-gAW7_y1nSUBVBISCYrbZjq9g4MwQ9oxpm8vBuPZnM13zoD0fPBIyC2FMaWgHhbT1XrMALKx4OKC9FnBaZqLXF6SAeSZkkwyCj3SpyBpKjJJr8mobXdwipBSMNUncoYRTXR-m6xD1NEFr_fJa3c4YGy6ZONrbJKJtc5jsmrC7tcGf0OurN63OPrrIdk8zt-mz-ny5WkxnSxTxyiLaa1tVZnKWFFjUYO1heSFNhnWyhYCKVNKZzavqDYgLTJjqFLIaybhNLMFH5L782_7jcevqjw27qCbrgzalTP3PilDsy0_40cpGHBx4ndn7hDxH9NMKQaC_wAlbFot
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
ADTPV
BNKNJ
D8V
DOI 10.1109/ICPR.2006.434
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE/IET Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
SwePub
SwePub Conference
SWEPUB Kungliga Tekniska Högskolan
DatabaseTitleList

Database_xml – sequence: 1
  dbid: RIE
  name: IEEE/IET Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Computer Science
EISSN 2831-7475
EndPage 295
ExternalDocumentID oai_DiVA_org_kth_42034
1699204
Genre orig-research
GroupedDBID 29J
6IE
6IF
6IK
6IL
6IN
AAJGR
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
IPLJI
JC5
OCL
RIE
RIG
RIL
RNS
AARBI
ADTPV
BNKNJ
D8V
ID FETCH-LOGICAL-i212t-dafbbcbcf4de8d0ff8538ac6ed9f84e1299a6f7b1ac05fe2cc199e3d250bcbf83
IEDL.DBID RIE
ISBN 0769525210
9780769525211
ISSN 1051-4651
IngestDate Mon Feb 19 06:49:32 EST 2024
Wed Jun 26 19:22:40 EDT 2024
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i212t-dafbbcbcf4de8d0ff8538ac6ed9f84e1299a6f7b1ac05fe2cc199e3d250bcbf83
PageCount 4
ParticipantIDs swepub_primary_oai_DiVA_org_kth_42034
ieee_primary_1699204
PublicationCentury 2000
PublicationDate 20060000
2006
PublicationDateYYYYMMDD 2006-01-01
PublicationDate_xml – year: 2006
  text: 20060000
PublicationDecade 2000
PublicationSeriesTitle INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION
PublicationTitle 18th International Conference on Pattern Recognition (ICPR'06)
PublicationTitleAbbrev ICPR
PublicationYear 2006
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000455429
ssj0020358
Score 1.7534139
Snippet A new method is presented for detecting planar rotational symmetry under affine projection. The method can deal with partial occlusion and is able to detect...
SourceID swepub
ieee
SourceType Open Access Repository
Publisher
StartPage 292
SubjectTerms Algorithm design and analysis
Computer vision
Detectors
Fourier transforms
Image segmentation
Manufacturing
Noise robustness
Object detection
Radio access networks
Shape
Title Detecting Rotational Symmetry Under Affine Projection
URI https://ieeexplore.ieee.org/document/1699204
https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-42034
Volume 2
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1JS8NAFH5UT3pxacW6kYPeTM0yM80ciwsqKOKGtzDLG6xiKyU91F_vmySmUjx4mxDekLxk-N76PYBD4UmvFJNhagULmVR0pGSCITqhrFEscpFvcL65FZdP7PqFv7TguOmFQcSy-Ax7flnm8u3YTH2o7CQWtI8n_1zqS1n1ajXxFDJN_OilxtmKUl61wXHykQSPK5dd8oTwquZ6aq7jOfnmydXp3X2Vo2B-mHI5cmWBRrSEnos1uPl56Kri5L03LXTPfC3wOf73rdahM2_yC-4a-NqAFo42Ye1nykNQH_pNWP1FWdgGfoY-7UDr4H5c1JHE4GH28YHFZBaUY5SCgXMk4Xd_Kyu9Rh14ujh_PL0M69EL4ZCwrAitclobbRyzmNnIOUL1TBmBVrqMIRkJUgnX17EyEXeYGBNLiaklg4rEXJZuwfJoPMJtCIThiRUos0yR66kJG7RIo8SSL6QtWT9daHud5J8Vu0Zeq6MLR5XOmxueCPts-DzISXv5e_GaM_rIbOdv8V1YmQdL9mC5mExxn8yHQh-U_803Mv2_Hw
link.rule.ids 230,310,311,783,787,792,793,799,888,4057,4058,27937,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3JTsMwEB1VcAAubEWUNQe4kZLFMfERsagsRQhaxC3yMhYFkSKUHuDrGSchRYgDN0fRWMkk1pv1DcAed6RXkgk_Npz5TEg6UiJCHy2XRksW2MA1OPdveG_ILh-TxxYcNL0wiFgWn2HXLctcvhnriQuVHYac9nHkn7NkV6e86tZqIipknLjhS427FcRJ1QiXkJfEk7By2kUSEWLVbE_NdTil3zy8OLm9q7IUzI1TLoeu_CISLcHnfBH6349d1Zy8dCeF6urPX4yO_32vJWhP2_y82wbAlqGF-Qosfs958OpjvwILP0gLVyE5RZd4oLV3Ny7qWKJ3__H6isX7h1cOUvKOrSUJt_tzWeuVt2F4fjY46fn18AV_RGhW-EZapbTSlhlMTWAt4XoqNUcjbMqQzAQhuT1SodRBYjHSOhQCY0MmFYnZNF6DmXyc4zp4XCeR4SjSVJLzqQgdFI-DyJA3pAzZPx1YdTrJ3ip-jaxWRwf2K503NxwV9uno4Tgj7WUvxVPG6COzjb_Fd2GuN-hfZ9cXN1ebMD8NnWzBTPE-wW0yJgq1U_5DX2H-wmo
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=18th+International+Conference+on+Pattern+Recognition+%28ICPR%2706%29&rft.atitle=Detecting+Rotational+Symmetry+Under+Affine+Projection&rft.au=Cornelius%2C+H.&rft.au=Loy%2C+G.&rft.date=2006-01-01&rft.pub=IEEE&rft.isbn=9780769525211&rft.issn=1051-4651&rft.eissn=2831-7475&rft.volume=2&rft.spage=292&rft.epage=295&rft_id=info:doi/10.1109%2FICPR.2006.434&rft.externalDocID=1699204
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1051-4651&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1051-4651&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1051-4651&client=summon