Detecting Rotational Symmetry Under Affine Projection

A new method is presented for detecting planar rotational symmetry under affine projection. The method can deal with partial occlusion and is able to detect multiple rotationally symmetric surfaces in complex backgrounds. The order of rotational symmetry can be estimated, and if it is greater than t...

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Bibliographic Details
Published in18th International Conference on Pattern Recognition (ICPR'06) Vol. 2; pp. 292 - 295
Main Authors Cornelius, H., Loy, G.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2006
SeriesINTERNATIONAL CONFERENCE ON PATTERN RECOGNITION
Subjects
Algorithm design and analysis
Computer vision
Detectors
Fourier transforms
Image segmentation
Manufacturing
Noise robustness
Object detection
Radio access networks
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Summary:A new method is presented for detecting planar rotational symmetry under affine projection. The method can deal with partial occlusion and is able to detect multiple rotationally symmetric surfaces in complex backgrounds. The order of rotational symmetry can be estimated, and if it is greater than two, the tilt and orientation of the rotationally symmetric surface can be found and the symmetric region segmented. Local features robust to local affine distortion are matched to obtain pairs of features. Each feature pair hypothesis a set of centres of rotation for different tilts and orientations and the centres of rotation that are close to each other are grouped together to find the dominant rotational symmetries in the image. The method is posed independently of a specific feature detector and descriptor. Results are presented on natural images
ISBN:0769525210
9780769525211
ISSN:1051-4651
2831-7475
DOI:10.1109/ICPR.2006.434