Advanced system for CMOS SOI test structures measurements

The article considers modernized CMOS SOI test structure measurement system that allows one to control characteristics of both separate transistors and VLSI blocks during experiment. Changes made in hardware and software parts of the measurement setup are discussed and reasoned.

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Bibliographic Details
Published in2016 International Siberian Conference on Control and Communications (SIBCON) pp. 1 - 4
Main Authors Shvetsov-Shilovskiy, I. I., Nekrasov, P. V., Ulanova, A. V., Nikiforov, A. Yu
Format Conference Proceeding Journal Article
LanguageEnglish
Published IEEE 01.05.2016
Subjects
CMOS
CMOS integrated circuits
CMOS SOI
Computer programs
Conferences
Control systems
Current measurement
Electronics
Frequency measurement
Hardware
Modernization
NET Framework
Nickel
PXI-5114
Relays
Software
Software measurement
Test structures
Voltage measurement
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Summary:The article considers modernized CMOS SOI test structure measurement system that allows one to control characteristics of both separate transistors and VLSI blocks during experiment. Changes made in hardware and software parts of the measurement setup are discussed and reasoned.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Conference-1
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SourceType-Conference Papers & Proceedings-2
ISSN:2380-6516
DOI:10.1109/SIBCON.2016.7491817