An evolutionary algorithm based approach to improve the limits of minimum thickness measurements of multilayered automotive paints

We present a novel numerical approach to decrease the limits of the minimum paint thickness measurements of individual layers in multilayered structures using terahertz pulsed technique in reflection geometry. This method combines the benefits of model-based material parameters extraction, a general...

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Bibliographic Details
Published in2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz) p. 1
Main Authors Krimi, S., Klier, J., Ellrich, F., Jonuscheit, J., Urbansky, R., Beigang, R., von Freymann, G.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.08.2015
Subjects
Nonhomogeneous media
Numerical models
Paints
Reflection
Substrates
Thickness measurement
Time-domain analysis
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Summary:We present a novel numerical approach to decrease the limits of the minimum paint thickness measurements of individual layers in multilayered structures using terahertz pulsed technique in reflection geometry. This method combines the benefits of model-based material parameters extraction, a generalized transfer matrix method, and an evolutionary optimization algorithm. The proposed approach has been successfully applied to resolve individual layer thicknesses down to 5 μm in multilayered automotive paint samples.
ISSN:2162-2027
DOI:10.1109/IRMMW-THz.2015.7327474