Determination of conductivity parameters of dielectrics used in space applications

• Published in: Proceedings of the 2004 IEEE International Conference on Solid Dielectrics, 2004. ICSD 2004 Vol. 2; pp. 936 - 939 Vol.2
• Main Authors: Bielby, R.M., Morris, P.A., Ryden, K.A., Rodgers, D.J., Sorensen, J.
• Format: Conference Proceeding
• Language: English
• Published: Piscataway NJ IEEE 2004
• Subjects: Applied sciences; Belts; Conducting materials; Conductivity measurement; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Electrical engineering. Electrical power engineering; Electrons; Exact sciences and technology; Materials; Space technology; Surface charging; Temperature dependence; Space application; Temperature dependence; Dielectric materials; Electron irradiation; Temperature effect; Facility; Glass fiber; Mathematical simulation; Surface potential
• ISBN: 0780383486; 9780780383487
• DOI: 10.1109/ICSD.2004.1350585

This paper presents a method for the determination of the conductivity of dielectric materials under radiation environments typical of those found in the Van Allen belts. Particular significance is given to the effects of both temperature and dose rate and their effects on the conductivity of dielectrics. The beginnings of the study are presented here with electron irradiations of /spl sim/1 mm thick samples of FEP teflon and FR-4 epoxy glass. Irradiations were performed in the QinetiQ relativistic electron environment facility (REEF) which utilises a /sup 90/Sr /spl beta/ emitting source. Results for both materials clearly illustrate the expected dependence of charging rates on temperature. Using a model of internal charging and measurements of surface potential during charging, the dose rate and temperature dependences of conductivity were calculated for each material. Provisional results of these calculations are presented in this paper.