Experimental Analyses of a Noise-Based True Random Number Generator

This work presents a fast, low power and simple structure noise-based true random number generator (TRNG) using discrete components and devices such as resistor., capacitor, diode., transistor., operational amplifier etc. Two NPN 2N3904 BJT transistors are employed in the noise-source circuit whereb...

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Bibliographic Details
Published in2023 IEEE 13th Annual Computing and Communication Workshop and Conference (CCWC) pp. 0915 - 0918
Main Authors Adesina, Naheem Olakunle, Wang, Baorui, Morell, William, Ullah Khan, Md Azmot
Format Conference Proceeding
LanguageEnglish
Published IEEE 08.03.2023
Subjects
Electric breakdown
Electrical noise
entropy
Generators
NIST
NIST SP800-22 tests
Operational amplifiers
post processing
Power demand
Resistors
TRNG
White noise
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Summary:This work presents a fast, low power and simple structure noise-based true random number generator (TRNG) using discrete components and devices such as resistor., capacitor, diode., transistor., operational amplifier etc. Two NPN 2N3904 BJT transistors are employed in the noise-source circuit whereby the collector terminal of one transistor is unconnected. A high electric field is induced by reverse biasing the emitter-base junction under high voltage. Current is injected into the base which lowers the noise voltage at the output node and then removes the transistor from breakdown region. Another random pulse also puts the transistor back into breakdown and the cycle continues. Subsequently, the noise signal generated is amplified by two LM741 op-amp each with a gain of 100. We employed 4007 series as digitizer to convert the amplified noise to digital pulses. The post processing technique is implemented with XOR operation., and the result shows the output data generated by TRNG pass all NIST SP800-22 tests.
DOI:10.1109/CCWC57344.2023.10099239