A Measurement-Referenced Error Vector Magnitude for Counterfeit Cellular Device Detection

Standard formulations of error vector magnitude compare a wireless device's symbol constellation to an ideal reference constellation. In this work, we utilize the residual error vector magnitude, which uses measurements of a wireless device to define a reference constellation. We apply this for...

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Bibliographic Details
Published in2023 101st ARFTG Microwave Measurement Conference (ARFTG) pp. 1 - 4
Main Authors Ramadurgakar, Ameya S, Remley, Kate A, Williams, Dylan F, Rezac, Jacob D, Piket-May, Melinda, Horansky, Robert D
Format Conference Proceeding
LanguageEnglish
Published IEEE 16.06.2023
Subjects
Analytical models
Antenna measurements
error vector magnitude (EVM)
Fingerprint recognition
long term evolution (LTE)
Measurement uncertainty
over-the-Air (OTA)
residual EVM
Uncertainty
user equipment (UE)
vector signal analyzer (VSA)
Wireless communication
Wireless sensor networks
wireless system
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Summary:Standard formulations of error vector magnitude compare a wireless device's symbol constellation to an ideal reference constellation. In this work, we utilize the residual error vector magnitude, which uses measurements of a wireless device to define a reference constellation. We apply this formulation to the problem of identifying a device's manufacturer from over-the-air measurements of the wireless device and show that the residual error vector magnitude outperforms standard error vector magnitude formulation in this task.
ISSN:2767-8776
DOI:10.1109/ARFTG57476.2023.10279175