Development of Machine Vision System for Detection of Wrap-Around in n-TOPCon Solar Cells

• Published in: 2023 IEEE 50th Photovoltaic Specialists Conference (PVSC) pp. 1 - 3
• Main Authors: Kim, Junhee, Kim, Han-Jung, Ko, Yohan, Kim, Yoonkap
• Format: Conference Proceeding
• Language: English
• Published: IEEE 11.06.2023
• Subjects: Machine vision; machine vision system; Microscopy; n-TOPCon; Optical losses; Optical microscopy; Photovoltaic cells; Photovoltaic systems; Production; wrap-around

n-TOPCon solar cells have been the subject of extensive research by various groups in order to overcome the limitations on efficiency of p-PERC solar cells. The passivated contacts formed on the rear side of wafers for the production of n-TOPCon solar cells are deposited using LPCVD or PECVD, howeve...