Development of Machine Vision System for Detection of Wrap-Around in n-TOPCon Solar Cells

n-TOPCon solar cells have been the subject of extensive research by various groups in order to overcome the limitations on efficiency of p-PERC solar cells. The passivated contacts formed on the rear side of wafers for the production of n-TOPCon solar cells are deposited using LPCVD or PECVD, howeve...

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Bibliographic Details
Published in2023 IEEE 50th Photovoltaic Specialists Conference (PVSC) pp. 1 - 3
Main Authors Kim, Junhee, Kim, Han-Jung, Ko, Yohan, Kim, Yoonkap
Format Conference Proceeding
LanguageEnglish
Published IEEE 11.06.2023
Subjects
Machine vision
machine vision system
Microscopy
n-TOPCon
Optical losses
Optical microscopy
Photovoltaic cells
Photovoltaic systems
Production
wrap-around
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Summary:n-TOPCon solar cells have been the subject of extensive research by various groups in order to overcome the limitations on efficiency of p-PERC solar cells. The passivated contacts formed on the rear side of wafers for the production of n-TOPCon solar cells are deposited using LPCVD or PECVD, however, wrap-around of heavily doped polysilicon is inevitable and results in optical loss and increased shunt resistance. Therefore, post-etching process of wrap-around is necessary and detection of wrap-around after the etching process is also required. In this study, we report on the development of a machine vision system based on a digital microscope equipped with a high-magnification zoom lens and controlled by operation software to minimize human intervention as much as possible. Although further optimization of the machine vision system is needed, we expect to achieve meaningful results after optimization.
DOI:10.1109/PVSC48320.2023.10359973