Fast Transient ESD Protection at RF Pins

Fast ESD events often cover the spectrum of the RF application circuit and imply a high impedance for passive ESD concepts. The resulting high voltage might destroy the RF-product. Very small ESD diodes improve the robustness of the chip against such fast transient events without significantly compr...

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Bibliographic Details
Published in2023 45th Annual EOS/ESD Symposium (EOS/ESD) Vol. EOS-45; pp. 1 - 8
Main Authors Eichenseer, Christoph, Langguth, Gernot, Gaertner, Reinhold, Nieden, Friedrich Zur, Zeitlhoefler, Lena, Kokorovic, Stefan
Format Conference Proceeding
LanguageEnglish
Published EOS/ESD Association, Inc 02.10.2023
Subjects
Electrostatic discharges
High-voltage techniques
Impedance
Pins
Radio frequency
Robustness
Transient analysis
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DOI10.23919/EOS/ESD58195.2023.10287754

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Summary:Fast ESD events often cover the spectrum of the RF application circuit and imply a high impedance for passive ESD concepts. The resulting high voltage might destroy the RF-product. Very small ESD diodes improve the robustness of the chip against such fast transient events without significantly compromising the RF performance.
DOI:10.23919/EOS/ESD58195.2023.10287754