Reliability of Computing-In-Memory Concepts Based on Memristive Arrays

Memristive Computing-in-Memory (CIM) allows for very dense and fast parallel data processing. However, the correctness in logic computing is limited due to operation variability and inherent memristive device variability. We review the current situation of reliability studies in memristive CIM and p...

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Bibliographic Details
Published in2022 International Electron Devices Meeting (IEDM) pp. 5.3.1 - 5.3.4
Main Authors Wouters, D. J., Brackmann, L., Jafari, A., Bengel, C., Mayahinia, M., Waser, R., Menzel, S., Tahoori, M.
Format Conference Proceeding
LanguageEnglish
Published IEEE 03.12.2022
Subjects
Common Information Model (computing)
Data processing
Electron devices
Reliability
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Summary:Memristive Computing-in-Memory (CIM) allows for very dense and fast parallel data processing. However, the correctness in logic computing is limited due to operation variability and inherent memristive device variability. We review the current situation of reliability studies in memristive CIM and propose a novel framework for estimating operation failures in CIM-concepts using VCM-ReRAM devices.
ISSN:2156-017X
DOI:10.1109/IEDM45625.2022.10019423