Simulation of Microarc Oxidation Process Based on Equivalent Electric Circuit

A mathematical model of the micro-arc oxidation process on the basis of an equivalent electrical circuit taking into account the influence of both external factors (temperature and electrolyte concentration) and micro-discharges has been developed. The parameters calculation of the equivalent circui...

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Published in2019 XXII International Conference on Soft Computing and Measurements (SCM) pp. 200 - 203
Main Authors Golubkov, P. E., Pecherskaya, E. A., Kochegarov, I. I., Safronov, M. I., Shepeleva, J. V.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.05.2019
Subjects
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DOI10.1109/SCM.2019.8903897

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Abstract A mathematical model of the micro-arc oxidation process on the basis of an equivalent electrical circuit taking into account the influence of both external factors (temperature and electrolyte concentration) and micro-discharges has been developed. The parameters calculation of the equivalent circuit on the basis of physical quantities, measured in the course of the process in real time. The proposed model can be used to identify the relationship of the resulting coatings properties from the electrical parameters of the technological mode, as well as to control the process of applying protective oxide coatings on light metals and alloys.
AbstractList A mathematical model of the micro-arc oxidation process on the basis of an equivalent electrical circuit taking into account the influence of both external factors (temperature and electrolyte concentration) and micro-discharges has been developed. The parameters calculation of the equivalent circuit on the basis of physical quantities, measured in the course of the process in real time. The proposed model can be used to identify the relationship of the resulting coatings properties from the electrical parameters of the technological mode, as well as to control the process of applying protective oxide coatings on light metals and alloys.
Author Shepeleva, J. V.
Safronov, M. I.
Pecherskaya, E. A.
Kochegarov, I. I.
Golubkov, P. E.
Author_xml – sequence: 1
  givenname: P. E.
  surname: Golubkov
  fullname: Golubkov, P. E.
  organization: Penza State University,Penza,Russian Federation
– sequence: 2
  givenname: E. A.
  surname: Pecherskaya
  fullname: Pecherskaya, E. A.
  organization: Penza State University,Penza,Russian Federation
– sequence: 3
  givenname: I. I.
  surname: Kochegarov
  fullname: Kochegarov, I. I.
  organization: Penza State University,Penza,Russian Federation
– sequence: 4
  givenname: M. I.
  surname: Safronov
  fullname: Safronov, M. I.
  organization: Penza State University,Penza,Russian Federation
– sequence: 5
  givenname: J. V.
  surname: Shepeleva
  fullname: Shepeleva, J. V.
  organization: Penza State University,Penza,Russian Federation
BookMark eNotz01LxDAUheEIunBG94Kb_IHWfJQ0WWqpHzBlhNH1kN7cwIVOq2kq-u8dmFkdeBYH3hW7HKcRGbuTopRSuIdd05VKSFdaJ7R19QVbyVpZqY2Q5pp1Ozosg880jXyKvCNIk0_At78UTvqeJsB55k9-xsCP0H4v9OMHHDNvB4ScCHhDCRbKN-wq-mHG2_Ou2edz-9G8Fpvty1vzuClICZ2L3gSPCFpHVwWvex0lqAoDVNGBUdIohGisMaKWsbamr7Rz8Wi9qgPYSq_Z_emXEHH_lejg09_-XKj_AaiRS3Y
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/SCM.2019.8903897
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Xplore POP ALL
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 1728136016
9781728136028
1728136024
9781728136011
EndPage 203
ExternalDocumentID 8903897
Genre orig-research
GroupedDBID 6IE
6IL
CBEJK
RIE
RIL
ID FETCH-LOGICAL-i203t-b6daeec33f94da3b3f1c24edc4f9c62162ecf6866071f786b4399fecfb27dc843
IEDL.DBID RIE
IngestDate Wed Aug 27 07:32:54 EDT 2025
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i203t-b6daeec33f94da3b3f1c24edc4f9c62162ecf6866071f786b4399fecfb27dc843
PageCount 4
ParticipantIDs ieee_primary_8903897
PublicationCentury 2000
PublicationDate 2019-May
PublicationDateYYYYMMDD 2019-05-01
PublicationDate_xml – month: 05
  year: 2019
  text: 2019-May
PublicationDecade 2010
PublicationTitle 2019 XXII International Conference on Soft Computing and Measurements (SCM)
PublicationTitleAbbrev SCM
PublicationYear 2019
Publisher IEEE
Publisher_xml – name: IEEE
Score 1.7082307
Snippet A mathematical model of the micro-arc oxidation process on the basis of an equivalent electrical circuit taking into account the influence of both external...
SourceID ieee
SourceType Publisher
StartPage 200
SubjectTerms calculation of parameters
Coatings
Current measurement
Electrolytes
equivalent electrical circuit
influence of electrolyte concentration and temperature
Integrated circuit modeling
Mathematical models
Metals
micro-arc oxidation
Oxidation
Pulse measurements
Temperature
Temperature measurement
Title Simulation of Microarc Oxidation Process Based on Equivalent Electric Circuit
URI https://ieeexplore.ieee.org/document/8903897
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3dS8MwED-2Pfmksonf5MFHu_UjS9tXy8YQqsIc7G00lwSCuOloQfzrvbTdRPHBt3IUEu6OXC73u_sB3CCdeQXywBNGuDJjIj0KI4UnpaHrPWVvZuy6kfMHMVvw--V42YHbfS-M1roGn-mh-6xr-WqDlXsqGyWpGwcXd6FLbtb0au0qj346mme5g2qR7ZvffvCl1OFiegj5bqEGJfIyrEo5xM9fMxj_u5MjGHw35rGnfcg5ho5e9yGf29eWhIttDMsdxI7clz1-2IYwibXdAOyOQpZiJJi8V5ZcjNZgk5oHxyLL7BYrWw5gMZ08ZzOvZUnwbOhHpSeFKrTGKDIpV0VE2g0w5FohNymKMBChRiMS4QbJmTgR0mUghmQyjBUmPDqB3nqz1qfABN01lDZRXBSca1-mQWTQ55SDoEjN2JxB36li9dYMwli1Wjj_W3wBB84cDTrwEnrlttJXFMFLeV2b7gshNp95
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEB5qPehJpRXf7sGjafPYbJKrpaVqU4W20FvJvmARWy0JiL_e2SStKB68hSGwYWbZbyfzfTMANwLPvExQz2Ga2TJjzB2EkczhXOP1HrM3HVo1cjpmwxl9mIfzBtxutTBKqZJ8pjr2sazly5Uo7K-ybpzYdnDRDuwi7tOwUmttao9u0p30UkvWwuhXL_6YmFICxuAA0s1SFU_kpVPkvCM-f3Vh_O-3HEL7W5pHnregcwQNtWxBOjGv9RgustIktSQ73MDk6cNUI5NIrQcgdwhakqCh_14Y3GS4BumXk3CMID2zFoXJ2zAb9Ke9oVPPSXCM7wa5w5nMlBJBoBMqswD96wmfKimoTgTzPeYroVnMbCs5HcWM2xxEo437kRQxDY6huVwt1QkQhrcNqXQQZRmlyuWJF2jhUsxCBEt0qE-hZV2xeKtaYSxqL5z9bb6GveE0HS1G9-PHc9i3oam4ghfQzNeFukQ8z_lVGcYvqJiixg
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2019+XXII+International+Conference+on+Soft+Computing+and+Measurements+%28SCM%29&rft.atitle=Simulation+of+Microarc+Oxidation+Process+Based+on+Equivalent+Electric+Circuit&rft.au=Golubkov%2C+P.+E.&rft.au=Pecherskaya%2C+E.+A.&rft.au=Kochegarov%2C+I.+I.&rft.au=Safronov%2C+M.+I.&rft.date=2019-05-01&rft.pub=IEEE&rft.spage=200&rft.epage=203&rft_id=info:doi/10.1109%2FSCM.2019.8903897&rft.externalDocID=8903897