Development of EMC analysis technology using large-scale electromagnetic field analysis

Recently, digital devices require LSI operated with higher frequency and lower voltage, therefore Countermeasures for EMC (Electromagnetic Compatibility) problem are becoming more difficult. Analytical EMC solving techniques, which contribute to design more directly and efficiently than the conventi...

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Bibliographic Details
Published in2019 41st Annual EOS/ESD Symposium (EOS/ESD) Vol. EOS-41; pp. 1 - 6
Main Authors Matsubara, Ryo, Inokuchi, Katsuo
Format Conference Proceeding
LanguageEnglish
Published EOS/ESD Association, Inc 01.09.2019
Subjects
Analytical models
Electromagnetic compatibility
Electrostatic discharges
Integrated circuit modeling
Metals
Printed circuits
Solid modeling
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Summary:Recently, digital devices require LSI operated with higher frequency and lower voltage, therefore Countermeasures for EMC (Electromagnetic Compatibility) problem are becoming more difficult. Analytical EMC solving techniques, which contribute to design more directly and efficiently than the conventional approach, has been developed for Electro Magnetic Radiation and Electro-Static Discharge.
DOI:10.23919/EOS/ESD.2019.8870011