On-chip repair and an ATE independent fusing methodology

This paper describes a novel on chip repair system designed for ATE independent application on many unique very dense ASIC devices in a high turnover environment. During test, the system controls on chip built-in self-test (BIST) engines, collects and compresses repair data, programs fuses and final...

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Bibliographic Details
Published inProceedings - International Test Conference pp. 178 - 186
Main Authors Cowan, B., Farnsworth, O., Jakobsen, P., Oakland, S., Ouellette, M.R., Wheater, D.L.
Format Conference Proceeding
LanguageEnglish
Published Piscataway NJ IEEE 2002
Subjects
Application specific integrated circuits
Applied sciences
Automatic testing
Control systems
Design. Technologies. Operation analysis. Testing
Electronics
Engines
Exact sciences and technology
Fuses
Integrated circuits
Laser theory
Process design
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Silicon
System testing
System-on-a-chip
Testing, measurement, noise and reliability
Test
Control system
Integrated circuit
Integrated circuit design
System design
Data fusion
System on a chip
Built in self test
Custom circuit
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Summary:This paper describes a novel on chip repair system designed for ATE independent application on many unique very dense ASIC devices in a high turnover environment. During test, the system controls on chip built-in self-test (BIST) engines, collects and compresses repair data, programs fuses and finally decompresses and reloads the repair data for post fuse testing. In end use applications this system decompresses and loads the repair data at power-up or at the request of the system.
ISBN:9780780375420
0780375424
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2002.1041759