Maintenance processor/time stress measurement device (MP/TSMD) use for failure trend analysis

The authors define the use of advanced built-in-test-equipment technology to reduce or eliminate reliability and maintainability problems associated with on-equipment fault detection and isolation. System supportability requirements for both mature and new systems defined the need for a subsystem le...

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Bibliographic Details
Published inAnnual Reliability and Maintainability Symposium 1992 Proceedings pp. 228 - 238
Main Authors Broadwater, S.P., Oblak, T.A., Popyack, L.J.
Format Conference Proceeding Journal Article
LanguageEnglish
Published IEEE 01.01.1992
Subjects
Automatic testing
Failure analysis
Fault detection
Maintenance
Microprocessors
Radar
Stress measurement
System testing
Vehicle detection
Weapons
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Summary:The authors define the use of advanced built-in-test-equipment technology to reduce or eliminate reliability and maintainability problems associated with on-equipment fault detection and isolation. System supportability requirements for both mature and new systems defined the need for a subsystem level device to perform built-in-test (BIT) functions in addition to capturing environmental stress data. To satisfy these requirements, a microprocessor-based maintenance processor/time stress measurement device (MP/TSMD) system was developed and field-tested. During 1992, the MP/TSMD will be operationally used to identify failure trends in the B-1B offensive radar system and to provide data for environmental stress simulation at the depot. The authors provide a technical description of the MP/TSMD and the fault logging system designed around it.< >
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ISBN:9780780305212
0780305213
DOI:10.1109/ARMS.1992.187827