Fabrication-tolerant wavelength (de)multiplexer based on cascaded Mach-Zehnder interferometers on silicon-on-insulator

We demonstrate a 4-channel 4.5-nm-spaced WDM (de)multiplexer based on fabrication-tolerant cascaded Mach-Zehnder interferometer configuration. Such unique device design greatly reduces the process-induced spectral shift from 9±4.7 nm to only 0.63± 0.52 nm across the whole wafer, verifying the effica...

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Bibliographic Details
Published in2020 Opto-Electronics and Communications Conference (OECC) pp. 1 - 3
Main Authors Yen, Tzu-Hsiang, Wang, Tai-Chun, Kou, Rai, Hung, Yung
Format Conference Proceeding
LanguageEnglish
Published IEEE 04.10.2020
Subjects
Mach-Zehnder interferometer
Optical device fabrication
Optical filters
Optical variables measurement
Optical waveguides
Photonics
Silicon
Silicon photonics
Wavelength division multiplexing
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Summary:We demonstrate a 4-channel 4.5-nm-spaced WDM (de)multiplexer based on fabrication-tolerant cascaded Mach-Zehnder interferometer configuration. Such unique device design greatly reduces the process-induced spectral shift from 9±4.7 nm to only 0.63± 0.52 nm across the whole wafer, verifying the efficacy of the proposed design methodology for dense WDM applications.
ISSN:2166-8892
DOI:10.1109/OECC48412.2020.9273728