Proton SEL test on dsPIC microcontroller to be used in ExoMars 2020 mission

Proton latch-up test results are presented to complete the TID and heavy ion SEL tests performed previously on Microchip microcontroller to assess its suitability to be used in an instrument on board ExoMars 2020 mission.

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Bibliographic Details
Published in2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) pp. 1 - 5
Main Authors Manzano, P., Alvarez, M., Manzano, J., Rivas, M.J., Martin-Ortega, A., Andres, N.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.2018
Subjects
Integrated circuits
Ions
Mars
Microcontrollers
Protons
Radiation effects
Silicon
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Summary:Proton latch-up test results are presented to complete the TID and heavy ion SEL tests performed previously on Microchip microcontroller to assess its suitability to be used in an instrument on board ExoMars 2020 mission.
ISSN:1609-0438
DOI:10.1109/RADECS45761.2018.9328676