Investigating the Electronic Properties of a Composite Dielectric under an Applied Electric Field by Muon Spectroscopy

• Published in: 2020 IEEE 3rd International Conference on Dielectrics (ICD) pp. 562 - 565
• Main Authors: Orton, B.A., Cottrell, S.P., Pratt, F.L., Dodd, S.J., Chalashkanov, N.M.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 05.07.2020
• Subjects: Charge carrier processes; Charge measurement; Dielectric measurement; Dielectrics; Electric fields; Mesons; Probes

The development of a new technique using implanted 100% spin polarized positive muons to probe the behaviour of charge carriers within dielectrics is described. Muons are a well-established method for probing materials at the atomic level. They offer a local probe sensitive both to bound molecular c...