Investigating the Electronic Properties of a Composite Dielectric under an Applied Electric Field by Muon Spectroscopy
The development of a new technique using implanted 100% spin polarized positive muons to probe the behaviour of charge carriers within dielectrics is described. Muons are a well-established method for probing materials at the atomic level. They offer a local probe sensitive both to bound molecular c...
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Published in | 2020 IEEE 3rd International Conference on Dielectrics (ICD) pp. 562 - 565 |
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Main Authors | , , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
05.07.2020
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Subjects | |
Online Access | Get full text |
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Summary: | The development of a new technique using implanted 100% spin polarized positive muons to probe the behaviour of charge carriers within dielectrics is described. Muons are a well-established method for probing materials at the atomic level. They offer a local probe sensitive both to bound molecular charges and to free charge carriers in materials. A muon study to investigate the charge distribution within a composite dielectric - consisting of epoxy, mica and glass fibre components- as a function of the externally applied electric field strength (E-field) is reported. Implanted muons react with the host epoxy molecule, undergo chemical addition at specific locations and probe the local electronic structure. Muon spectra are interpreted through a comparison with the electronic structure calculated using Density Functional Theory.It is shown that the application of an external E-field modifies the form of the observed spectra. It is believed that the effect of an E-field on identified bound charges within the molecule is being observed, suggesting muons are an excellent probe for understanding local charge redistributions in polymeric dielectrics. |
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DOI: | 10.1109/ICD46958.2020.9342014 |