Impact of post deposition treatment on optoelectrical and microstructural properties of tin sulfide thin film for photovoltaic applications

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Bibliographic Details
Published inPhysica scripta Vol. 99; no. 7
Main Authors Nisha, Sarkar, Prosenjit, Kumar, Pawan, Katiyar, Ram S
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.07.2024
Subjects
hall measurement
photovoltaic
thermal evaporation
tin sulfide
XPS
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Bibliography:PHYSSCR-129023.R2
ISSN:0031-8949
1402-4896
DOI:10.1088/1402-4896/ad511a