Integration of III-V nanowires on Si: From high-performance vertical FET to steep-slope switch

In this paper, we present recent progress in the integration of vertical III-V nanowire-channels on Si by selective-area epitaxy and demonstrations of high-performance III-V vertical surrounding-gate transistors with high-k dielectrics with an EOT of less than 1 nm, modulation doping technique, and...

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Published in2013 IEEE International Electron Devices Meeting pp. 4.1.1 - 4.1.4
Main Authors Tomioka, Katsuhiro, Yoshimura, Masatoshi, Nakai, Eiji, Ishizaka, Fumiya, Fukui, Takashi
Format Conference Proceeding Journal Article
LanguageEnglish
Published IEEE 01.12.2013
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Summary:In this paper, we present recent progress in the integration of vertical III-V nanowire-channels on Si by selective-area epitaxy and demonstrations of high-performance III-V vertical surrounding-gate transistors with high-k dielectrics with an EOT of less than 1 nm, modulation doping technique, and challenges in steep subthreshold-slope switching using III-V nanowire/Si heterojunctions as building blocks for low power circuits.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Conference-1
ObjectType-Feature-3
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SourceType-Conference Papers & Proceedings-2
ISSN:0163-1918
2156-017X
DOI:10.1109/IEDM.2013.6724557