Broadband complex permittivity measurements of dielectric substrates using a split-cylinder resonator

• Published in: 2004 IEEE MTT-S International Microwave Symposium Vol. 3; pp. 1817 - 1820 Vol.3
• Main Authors: Janezic, M.D., Kuester, E.F., Jarvis, J.B.
• Format: Conference Proceeding
• Language: English
• Published: Piscataway NJ IEEE 2004
• Subjects: Acoustic wave devices, piezoelectric and piezoresistive devices; Applied sciences; Circuit properties; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Dielectric substrates; Electric, optical and optoelectronic circuits; Electronic circuits; Electronics; Exact sciences and technology; Frequency measurement; Loss measurement; Magnetic field measurement; Magnetic resonance; Oscillators, resonators, synthetizers; Permittivity measurement; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Tellurium; Testing, measurement, noise and reliability; Dielectric loss; Permittivity measurement; Dielectric resonator; Dielectric measurement; Dielectric substrate; Electric field; Theoretical model; Wide band; Cylindrical cavity; Circular cylinder; Magnetic field; Complex permittivity; Permittivity; Non destructive test

We discuss a theoretical model describing the split-cylinder resonator for non-destructive measurement of a dielectric substrate's relative permittivity and loss tangent. This improved model properly accounts for the fringing electric and magnetic fields in the dielectric substrate. Previously,...