System CDM Modeling for High-Speed Interface Devices

Conventional simulation methods for Charged Device Model (CDM) peak current estimation, based on separate tester and IC lumped-element models, fail to capture fast transient phenomena at ultra-high-speed interfaces. A more comprehensive modeling approach, including on-die and package distributed par...

Full description

Saved in:
Bibliographic Details
Published in2024 46th Annual EOS/ESD Symposium (EOS/ESD) Vol. 46; pp. 1 - 9
Main Authors Groppo, Emanuele, Gossner, Harald, Domanski, Krzysztof, Dua, Raj, Gong, Jian, Carn, Brett, Zia, Victor, Brederlow, Ralf
Format Conference Proceeding
LanguageEnglish
Published EOS/ESD Association, Inc 16.09.2024
Subjects
Electrostatic discharges
Estimation
Integrated circuit modeling
Predictive models
Qualifications
Transient analysis
Online AccessGet full text
DOI10.23919/EOS/ESD61719.2024.10702134

Cover

More Information
Summary:Conventional simulation methods for Charged Device Model (CDM) peak current estimation, based on separate tester and IC lumped-element models, fail to capture fast transient phenomena at ultra-high-speed interfaces. A more comprehensive modeling approach, including on-die and package distributed parasitics, yields better predictive capabilities with respect to CDM qualification test results.
DOI:10.23919/EOS/ESD61719.2024.10702134