A Sub-Sampling Front-End with 12 fF Load for On-Chip Measurements

A sub-sampling front-end with a low capacitive loading followed by a second order \Sigma\Delta ADC is presented. The front end is designed in the UMC 65nm low-power CMOS process and has a power consumption of 110 µW from a 1.2 V supply. The ADC has a simulated SQNR of around 74 dB and an ENOB of aro...

Full description

Saved in:
Bibliographic Details
Published inConference proceedings : Midwest Symposium on Circuits and Systems pp. 956 - 959
Main Authors R., Aashish T., Chatterjee, Shouri
Format Conference Proceeding
LanguageEnglish
Published IEEE 11.08.2024
Subjects
Online AccessGet full text
ISSN1558-3899
DOI10.1109/MWSCAS60917.2024.10658703

Cover

Abstract A sub-sampling front-end with a low capacitive loading followed by a second order \Sigma\Delta ADC is presented. The front end is designed in the UMC 65nm low-power CMOS process and has a power consumption of 110 µW from a 1.2 V supply. The ADC has a simulated SQNR of around 74 dB and an ENOB of around 12 bits. The time constant of the sampling front-end comes to nearly 0.76 ps. The entire front end occupies an area of 200 µm x 550 µm.
AbstractList A sub-sampling front-end with a low capacitive loading followed by a second order \Sigma\Delta ADC is presented. The front end is designed in the UMC 65nm low-power CMOS process and has a power consumption of 110 µW from a 1.2 V supply. The ADC has a simulated SQNR of around 74 dB and an ENOB of around 12 bits. The time constant of the sampling front-end comes to nearly 0.76 ps. The entire front end occupies an area of 200 µm x 550 µm.
Author R., Aashish T.
Chatterjee, Shouri
Author_xml – sequence: 1
  givenname: Aashish T.
  surname: R.
  fullname: R., Aashish T.
  organization: Samsung Semiconductor India Research,Analog IP Development
– sequence: 2
  givenname: Shouri
  surname: Chatterjee
  fullname: Chatterjee, Shouri
  organization: Indian Institute of Technology,Department of Electrical Engineering
BookMark eNo1j9FKwzAYRqMouM29gRfxAVLzJ22T_7KUbQodu6ji5UjbxEXWtLQd4ttbUK_OBwc-OEtyE7pgCXkEHgFwfNq_l3lWphxBRYKLOAKeJlpxeUXWqFDLhEutQOE1WUCSaCY14h1ZjuMn50IqwAXJMlpeKlaatj_78EG3QxcmtgkN_fLTiYKgbkuLzjTUdQM9BJaffE_31oyXwbY2TOM9uXXmPNr1H1fkbbt5zZ9Zcdi95FnBPKh0YsIhxAJqbMBJN8_GOt24CqAC7WbhJFRmlgZqCTFXDTfc1LoGdDJFK1fk4ffXW2uP_eBbM3wf_5PlDzIkTDw
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/MWSCAS60917.2024.10658703
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Xplore
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 9798350387179
EISSN 1558-3899
EndPage 959
ExternalDocumentID 10658703
Genre orig-research
GroupedDBID 29B
6IE
6IF
6IH
6IK
6IL
6IM
6IN
AAJGR
AAWTH
ABLEC
ACGFS
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
IJVOP
IPLJI
M43
OCL
RIE
RIL
RIO
RNS
ID FETCH-LOGICAL-i176t-2f91421c9d1f3f142def8dfb11b18f21cf31bad1fa1c31407d0a0ac8c19f369e3
IEDL.DBID RIE
IngestDate Wed Aug 27 02:00:27 EDT 2025
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i176t-2f91421c9d1f3f142def8dfb11b18f21cf31bad1fa1c31407d0a0ac8c19f369e3
PageCount 4
ParticipantIDs ieee_primary_10658703
PublicationCentury 2000
PublicationDate 2024-Aug.-11
PublicationDateYYYYMMDD 2024-08-11
PublicationDate_xml – month: 08
  year: 2024
  text: 2024-Aug.-11
  day: 11
PublicationDecade 2020
PublicationTitle Conference proceedings : Midwest Symposium on Circuits and Systems
PublicationTitleAbbrev MWSCAS
PublicationYear 2024
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0023719
Score 2.2643445
Snippet A sub-sampling front-end with a low capacitive loading followed by a second order \Sigma\Delta ADC is presented. The front end is designed in the UMC 65nm...
SourceID ieee
SourceType Publisher
StartPage 956
SubjectTerms Circuits and systems
CMOS process
high frequency
Loading
low capacitive loading
Power demand
sub-sampling
System-on-chip
Title A Sub-Sampling Front-End with 12 fF Load for On-Chip Measurements
URI https://ieeexplore.ieee.org/document/10658703
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LSwMxEA7ag-jFV8U3Ebxm3dlkN8mxlC4itgq12FvJ5qFF2BbdXvz1JtuXCoK3kBASZpJ8mcnMF4SuM2dEKhJDuGExYRYcKVJtiRRCGpU6v7_qaItedjtgd8N0uEhWr3NhrLV18JmNQrF-yzcTPQuuMr_DPV7ywO256dfZPFlrZV1RDnILXS1ING-6z_12q595OOTeCkxYtOz84xuVGkXyXdRbjj8PHnmLZlUR6c9f1Iz_nuAeaq4T9vDjCor20YYtD9DON67BQ9RqYX9IkL4KIeTlC84DcwHplAYHVyyGBLsc30-Uwf4aix9K0n4dT3F37UL8aKJB3nlq35LF_wlkDDyrSOIlzRLQ0oCjzheNdcK4AqAA4XyDo1Ao36hAU29ocROrWGmhQTqaSUuPUKOclPYYYY9Z3ILVXLmUqSRTlDklY6pFbBlV5gQ1gzRG0zlFxmgpiNM_6s_QdlBKcM4CnKNG9T6zFx7dq-Ky1uoXpIeimQ
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LSwMxEA5SwcfFV8W3Ebxm3dlkN9ljKS1V2yq0xd5KNg8twrbo9uKvN9m2VgXBW0gIDBMmX2Yy8w1C14nVIhaRJlyzkDADlmSxMiQVItUyts6-ymyLbtIasLthPFwUq5e1MMaYMvnMBH5Y_uXriZr5UJmzcIeX3HN7rjvgZ_G8XOvLv6Ic0g10taDRvOk89eq1XuIAkTs_MGLBcvuPRioljjR3UHcpwTx95DWYFVmgPn6RM_5bxF1UXZXs4ccvMNpDaybfR9vf2AYPUK2G3TVBetInkefPuOm5C0gj19gHYzFE2DZxeyI1dg9Z_JCT-st4ijurIOJ7FQ2ajX69RRYdFMgYeFKQyOmaRaBSDZZaN9TGCm0zgAyEdQuWQibdogRFnavFdShDqYSC1NIkNfQQVfJJbo4QdqjFDRjFpY2ZjBJJmZVpSJUIDaNSH6Oq18ZoOifJGC0VcfLH_CXabPU77VH7tnt_irb8AflQLcAZqhRvM3PusL7ILsoT_gRb-aXm
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Conference+proceedings+%3A+Midwest+Symposium+on+Circuits+and+Systems&rft.atitle=A+Sub-Sampling+Front-End+with+12+fF+Load+for+On-Chip+Measurements&rft.au=R.%2C+Aashish+T.&rft.au=Chatterjee%2C+Shouri&rft.date=2024-08-11&rft.pub=IEEE&rft.eissn=1558-3899&rft.spage=956&rft.epage=959&rft_id=info:doi/10.1109%2FMWSCAS60917.2024.10658703&rft.externalDocID=10658703