R., A. T., & Chatterjee, S. (2024, August 11). A Sub-Sampling Front-End with 12 fF Load for On-Chip Measurements. Conference proceedings : Midwest Symposium on Circuits and Systems, 956-959. https://doi.org/10.1109/MWSCAS60917.2024.10658703
Chicago Style (17th ed.) CitationR., Aashish T., and Shouri Chatterjee. "A Sub-Sampling Front-End with 12 FF Load for On-Chip Measurements." Conference Proceedings : Midwest Symposium on Circuits and Systems 11 Aug. 2024: 956-959. https://doi.org/10.1109/MWSCAS60917.2024.10658703.
MLA (9th ed.) CitationR., Aashish T., and Shouri Chatterjee. "A Sub-Sampling Front-End with 12 FF Load for On-Chip Measurements." Conference Proceedings : Midwest Symposium on Circuits and Systems, 11 Aug. 2024, pp. 956-959, https://doi.org/10.1109/MWSCAS60917.2024.10658703.