The use of phonon and plasmon interface modes as diagnostic tools for characterising low dimensional semiconductor structures

Far infrared Fourier transform spectroscopy is a well-established technique for investigating the response functions of phonons and plasmons in bulk and low-dimensional semiconductors. When oblique incidence measurements are made in p-polarisation on low dimensional semiconductors, either by convent...

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Bibliographic Details
Published inTwenty Seventh International Conference on Infrared and Millimeter Waves p. 27
Main Authors Mirjalili, G., Shayesteh, S.F., Parker, T.J., Cheng, T.S., Foxon, C.T.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2002
Subjects
Attenuation measurement
Fourier transforms
Infrared spectra
Optical reflection
Phonons
Physics
Plasma measurements
Plasmons
Probes
Spectroscopy
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Summary:Far infrared Fourier transform spectroscopy is a well-established technique for investigating the response functions of phonons and plasmons in bulk and low-dimensional semiconductors. When oblique incidence measurements are made in p-polarisation on low dimensional semiconductors, either by conventional reflection spectroscopy or by attenuated total reflection (ATR) spectroscopy, additional spectral features are observed associated with Berreman or Brewster interface modes. We demonstrate that these modes can be used as diagnostic tools for obtaining detailed information on the structural and electronic properties of the structures.
ISBN:9780780374232
0780374231
DOI:10.1109/ICIMW.2002.1076067