Memristor Drift Model based on conservation of mobile vacancies
A significant percentage of the analysis applied to memristors is based on the Linear Drift Model. In the Linear Drift Model the resistance of the doped region increases in direct proportion to the width of the doped region. It is shown that this is not consistent with the physical conservation of t...
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Published in | 45th Southeastern Symposium on System Theory pp. 12 - 16 |
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Main Authors | , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.03.2013
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Abstract | A significant percentage of the analysis applied to memristors is based on the Linear Drift Model. In the Linear Drift Model the resistance of the doped region increases in direct proportion to the width of the doped region. It is shown that this is not consistent with the physical conservation of the mobile vacancies. A circuit model is proposed which is consistent with the conservation of the mobile vacancies and takes into account a high constant intrinsic resistivity indicative of the memristor "off state". A numerical analysis (NA) scheme is tested and compared with reported Hewlett Packard memristor data and with the theoretical solution for the Linear Drift Model. |
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AbstractList | A significant percentage of the analysis applied to memristors is based on the Linear Drift Model. In the Linear Drift Model the resistance of the doped region increases in direct proportion to the width of the doped region. It is shown that this is not consistent with the physical conservation of the mobile vacancies. A circuit model is proposed which is consistent with the conservation of the mobile vacancies and takes into account a high constant intrinsic resistivity indicative of the memristor "off state". A numerical analysis (NA) scheme is tested and compared with reported Hewlett Packard memristor data and with the theoretical solution for the Linear Drift Model. |
Author | Pieper, R. J. Rudra, M. R. |
Author_xml | – sequence: 1 givenname: M. R. surname: Rudra fullname: Rudra, M. R. email: mrudra@patriots.uttyler.edu organization: Dept. of Electr. Eng., Univ. of Texas at Tyler, Tyler, TX, USA – sequence: 2 givenname: R. J. surname: Pieper fullname: Pieper, R. J. organization: Dept. of Electr. Eng., Univ. of Texas at Tyler, Tyler, TX, USA |
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Snippet | A significant percentage of the analysis applied to memristors is based on the Linear Drift Model. In the Linear Drift Model the resistance of the doped region... |
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SubjectTerms | Conductivity Integrated circuit modeling linear drift model Mathematical model memristor Memristors Mobile communication numerical analysis Numerical models Resistance |
Title | Memristor Drift Model based on conservation of mobile vacancies |
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