Surviving state disruptions caused by test: A case study

The practice of initializing a board or system for testing purposes is not an exact science, but rather, pursued empirically and with an increasing risk of undesired side effects. It has been suspected that Boundary-Scan testing can cause such side effects. This paper provides a case study of such a...

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Bibliographic Details
Published in2011 IEEE International Test Conference pp. 1 - 8
Main Authors Parker, K. P., Kameyama, S., Dubberke, D.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.2011
Subjects
Flip-flops
Integrated circuits
Pins
Registers
Regulators
Testing
Voltage control
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Summary:The practice of initializing a board or system for testing purposes is not an exact science, but rather, pursued empirically and with an increasing risk of undesired side effects. It has been suspected that Boundary-Scan testing can cause such side effects. This paper provides a case study of such a board where a detailed root-cause analysis was performed. Some issues are identified that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing and to leave it in a safe state upon completion of testing.
ISBN:9781457701535
1457701537
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2011.6139140