Record 47 mV/dec top-down vertical nanowire InGaAs/GaAsSb tunnel FETs

Pocketed vertical nanowire InGaAs/GaAsSb tunnel FETs (TFET) with sub-threshold swing (SS) reaching 47 mV/dec are demonstrated. The achieved sub-threshold performance is the steepest reported so far for a top-down TFET in the III-V material system. Smooth vertical wires with diameters as narrow as 30...

Full description

Saved in:
Bibliographic Details
Published in2018 IEEE Symposium on VLSI Technology pp. 133 - 134
Main Authors Alian, Alireza, Kazzi, Salim El, Verhulst, Anne, Milenin, Alexey, Pinna, Nicolo, Ivanov, Tsvetan, Lin, Dennis, Mocuta, Dan, Collaert, Nadine
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.06.2018
Subjects
Online AccessGet full text
ISSN2158-9682
DOI10.1109/VLSIT.2018.8510619

Cover

Abstract Pocketed vertical nanowire InGaAs/GaAsSb tunnel FETs (TFET) with sub-threshold swing (SS) reaching 47 mV/dec are demonstrated. The achieved sub-threshold performance is the steepest reported so far for a top-down TFET in the III-V material system. Smooth vertical wires with diameters as narrow as 30 nm are achieved using a CH 4 based dry etch process. Drive current at 0.35 V supply voltage approaches 0.7 μA/μm for a fixed I off of 1 nA/μm.
AbstractList Pocketed vertical nanowire InGaAs/GaAsSb tunnel FETs (TFET) with sub-threshold swing (SS) reaching 47 mV/dec are demonstrated. The achieved sub-threshold performance is the steepest reported so far for a top-down TFET in the III-V material system. Smooth vertical wires with diameters as narrow as 30 nm are achieved using a CH 4 based dry etch process. Drive current at 0.35 V supply voltage approaches 0.7 μA/μm for a fixed I off of 1 nA/μm.
Author Milenin, Alexey
Lin, Dennis
Ivanov, Tsvetan
Kazzi, Salim El
Collaert, Nadine
Alian, Alireza
Mocuta, Dan
Verhulst, Anne
Pinna, Nicolo
Author_xml – sequence: 1
  givenname: Alireza
  surname: Alian
  fullname: Alian, Alireza
  organization: imec vzw, Leuven, 3001, Belgium
– sequence: 2
  givenname: Salim El
  surname: Kazzi
  fullname: Kazzi, Salim El
  organization: imec vzw, Leuven, 3001, Belgium
– sequence: 3
  givenname: Anne
  surname: Verhulst
  fullname: Verhulst, Anne
  organization: imec vzw, Leuven, 3001, Belgium
– sequence: 4
  givenname: Alexey
  surname: Milenin
  fullname: Milenin, Alexey
  organization: imec vzw, Leuven, 3001, Belgium
– sequence: 5
  givenname: Nicolo
  surname: Pinna
  fullname: Pinna, Nicolo
  organization: imec vzw, Leuven, 3001, Belgium
– sequence: 6
  givenname: Tsvetan
  surname: Ivanov
  fullname: Ivanov, Tsvetan
  organization: imec vzw, Leuven, 3001, Belgium
– sequence: 7
  givenname: Dennis
  surname: Lin
  fullname: Lin, Dennis
  organization: imec vzw, Leuven, 3001, Belgium
– sequence: 8
  givenname: Dan
  surname: Mocuta
  fullname: Mocuta, Dan
  organization: imec vzw, Leuven, 3001, Belgium
– sequence: 9
  givenname: Nadine
  surname: Collaert
  fullname: Collaert, Nadine
  organization: imec vzw, Leuven, 3001, Belgium
BookMark eNotj11LwzAYhaNMcJ3-Ab3JH2ibN2k-ejnGnIWC4D5uR5q8hUqXjrY6_Pd2uJtz4HngwInILHQBCXkBlgCwPD2U22KXcAYmMRKYgvyORCCFURkHw-_JnIM0ca4MfyTRMHwxxtmk52T9ia7rPc00PR1Sj46O3Tn23SXQH-zHxtmWBhu6S9MjLcLGLof0GtuKjt8hYEvf1rvhiTzUth3w-dYLsp_w6j0uPzbFalnGDWg5xp5VzoLSjoOVoGpjcqNdjbUHZbnBKpsYaCsY1iitAqkzLyqhJMrKiVwsyOv_boOIx3PfnGz_e7xdFn8sUEt-
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/VLSIT.2018.8510619
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 1538642182
9781538642184
EISSN 2158-9682
EndPage 134
ExternalDocumentID 8510619
Genre orig-research
GroupedDBID 29G
6IE
6IH
6IL
6IN
AAWTH
ABLEC
ADZIZ
AI.
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
IJVOP
OCL
RIE
RIL
RIO
RNS
VH1
ID FETCH-LOGICAL-i175t-d0bca167c21a516f88987cfefd16a28eb46f817a30efe5a61574d3b365e5bc393
IEDL.DBID RIE
IngestDate Wed Aug 27 02:52:38 EDT 2025
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i175t-d0bca167c21a516f88987cfefd16a28eb46f817a30efe5a61574d3b365e5bc393
PageCount 2
ParticipantIDs ieee_primary_8510619
PublicationCentury 2000
PublicationDate 2018-June
PublicationDateYYYYMMDD 2018-06-01
PublicationDate_xml – month: 06
  year: 2018
  text: 2018-June
PublicationDecade 2010
PublicationTitle 2018 IEEE Symposium on VLSI Technology
PublicationTitleAbbrev VLSIT
PublicationYear 2018
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0020538
ssj0002685526
Score 2.1740882
Snippet Pocketed vertical nanowire InGaAs/GaAsSb tunnel FETs (TFET) with sub-threshold swing (SS) reaching 47 mV/dec are demonstrated. The achieved sub-threshold...
SourceID ieee
SourceType Publisher
StartPage 133
SubjectTerms Doping
Junctions
Logic gates
Performance evaluation
Silicon
TFETs
Wires
Title Record 47 mV/dec top-down vertical nanowire InGaAs/GaAsSb tunnel FETs
URI https://ieeexplore.ieee.org/document/8510619
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LSwMxEA5tT3rx0YpvcvBodrPdZDc5irS2oiL0QW8lTxBxt9jdi7_eZHdbH3jwkoQEQpgJzEzyzTcAXDFCsZCpQm49QUQoixgjHBmDtcVKaVKzfT4loxm5X9BFC1xvc2GMMRX4zAR-WP3l61yV_qksdN6BMz-8DdrumtW5Wtv3lH7CKPWuRBNsucvFNkkymIfzh8l46pFcLGh2-VFOpbImwz3wuDlHDSJ5DcpCBurjF0Xjfw-6D3pfeXvweWuRDkDLZIdg9xvlYBcM6ngTkhS-zUNtFCzyFdIuFodVZWanMpiJLPcUxnCc3YmbdeibiYRF6TExcDiYrntg5rrbEWpKKaAX5x8USGOpRJSkqh8JGiWWMc5SZY3VUSL6zEji5qJUxNhYQ4Vzc1KiYxkn1FCpYh4fgU6WZ-YYQKGtsJTYlOvYtZgbZlXKMSOSMELICeh6gSxXNVvGspHF6d_TZ2DHK6UGX52DTvFemgtn5gt5Wen3E8PPpgc
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3JTsMwELVKOQAXlhax4wNHkjqNndhHhFpaaCukLuqt8iohRFLR5MLXYydpWcSBi2M5UmTNRHoz9ps3ANxQTBAXsfTs-8jDXBqPUsw8rZEySEqFS7XPUdSb4sc5mdfA7aYWRmtdkM-076bFXb5KZe6Oylo2OrDww7bAtsV9TMpqrc2JSjuihLhgokq37O9F12UyiLVmg3F_4rhc1K--86OhSoEn3X0wXO-kpJG8-nkmfPnxS6Txv1s9AM2vyj34vMGkQ1DTyRHY-yY62ACdMuOEOIZvs5bSEmbp0lM2G4dFb2brNJjwJHUixrCfPPC7VcsNYwGz3LFiYLczWTXB1D7ue17VTMF7sRFC5ikkJA-iWLYDToLIUMpoLI02Koh4m2qB7VoQ8xBpowm3gU6MVSjCiGgiZMjCY1BP0kSfAMiV4YZgEzMV2hExTY2MGaJYYIoxPgUNZ5DFstTLWFS2OPt7-Rrs9CbDwWLQHz2dg13noJKKdQHq2XuuLy3oZ-Kq8PUnqT-pVA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2018+IEEE+Symposium+on+VLSI+Technology&rft.atitle=Record+47+mV%2Fdec+top-down+vertical+nanowire+InGaAs%2FGaAsSb+tunnel+FETs&rft.au=Alian%2C+Alireza&rft.au=Kazzi%2C+Salim+El&rft.au=Verhulst%2C+Anne&rft.au=Milenin%2C+Alexey&rft.date=2018-06-01&rft.pub=IEEE&rft.eissn=2158-9682&rft.spage=133&rft.epage=134&rft_id=info:doi/10.1109%2FVLSIT.2018.8510619&rft.externalDocID=8510619