Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers

Testing is an essential, but time and resource consuming activity in the software development process. In the case of model-based development, among other subtasks test construction and test execution can be partially automated. Our paper describes the implementation of a test generator framework th...

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Bibliographic Details
Published in2006 International Conference on Dependability of Computer Systems pp. 191 - 198
Main Authors Micskei, Z., Majzik, I.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.05.2006
Subjects
Automatic testing
Embedded system
Information systems
Programming
Robots
Software measurement
Software testing
State-space methods
System testing
Time measurement
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Summary:Testing is an essential, but time and resource consuming activity in the software development process. In the case of model-based development, among other subtasks test construction and test execution can be partially automated. Our paper describes the implementation of a test generator framework that uses an external model checker to construct test sequences. The possible configurations of the model checker are examined by measuring the efficiency of test construction in the case of different statechart models of event-driven embedded systems. The generated test cases are transformed and executed on common testing frameworks (JUnit, rational robot) and the effectiveness of tests are measured using code coverage metrics
ISBN:9780769525655
0769525652
DOI:10.1109/DEPCOS-RELCOMEX.2006.37