Apply tapping mode Atomic Force Microscope with CD/DVD pickup head in fluid

This paper proposes a tapping mode scanning sample type Atomic Force Microscope (AFM) equipped with a CD/DVD pick-up-head (PUH) used to measure the deflection of the cantilever beam of the probe in the liquid. To start with, we build an adaptive Quality-Factor-controller (Q-controller) to modulate t...

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Bibliographic Details
Published inProceedings of the 2010 American Control Conference pp. 6549 - 6554
Main Authors Shih-Hsun Yen, Jim-Wei Wu, Li-Chen Fu
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.06.2010
Subjects
Adaptive control
Atomic beams
Atomic force microscopy
Atomic measurements
Force measurement
Probes
Programmable control
Sliding mode control
Structural beams
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Summary:This paper proposes a tapping mode scanning sample type Atomic Force Microscope (AFM) equipped with a CD/DVD pick-up-head (PUH) used to measure the deflection of the cantilever beam of the probe in the liquid. To start with, we build an adaptive Quality-Factor-controller (Q-controller) to modulate the interaction force between the tip and the sample. To implement the above systems, we have designed a novel AFM mechanism and proposed an adaptive sliding-mode controller for it. For testing the system capability and analyzing the biomorphic change of the sample in liquid, we have conducted a series of experiments, and the results can help us to understand more about the mechanism of the sample in liquid.
ISBN:9781424474264
1424474264
ISSN:0743-1619
2378-5861
DOI:10.1109/ACC.2010.5531415