A new method for estimating spectral performance of ADC from INL

• Published in: 2010 IEEE International Test Conference pp. 1 - 10
• Main Authors: Jingbo Duan, Le Jin, Degang Chen
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.11.2010
• Subjects: Built-in self-test; Equations; Harmonic analysis; Linearity; Mathematical model; Noise

Linearity test and spectral test are two main contributors of ADC test cost which includes data acquisition time and accurate instrumentation. This paper presents a new method for estimating an ADC's spectral performance from its tested INL data. The method does not require additional dedicated...