A new method for estimating spectral performance of ADC from INL

Linearity test and spectral test are two main contributors of ADC test cost which includes data acquisition time and accurate instrumentation. This paper presents a new method for estimating an ADC's spectral performance from its tested INL data. The method does not require additional dedicated...

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Bibliographic Details
Published in2010 IEEE International Test Conference pp. 1 - 10
Main Authors Jingbo Duan, Le Jin, Degang Chen
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.11.2010
Subjects
Built-in self-test
Equations
Harmonic analysis
Linearity
Mathematical model
Noise
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Summary:Linearity test and spectral test are two main contributors of ADC test cost which includes data acquisition time and accurate instrumentation. This paper presents a new method for estimating an ADC's spectral performance from its tested INL data. The method does not require additional dedicated test circuitry or data acquisition. The results from INL test are used to compute harmonic distortions and other spectral specifications of the ADC. Memory and computation requirements are very small comparing to those in traditional spectral testing. When combined with a BIST approach for INL testing, the proposed method offers a very low cost BIST solution to ADC spectral testing. Both simulation and experimental results show that the proposed method can estimate THD and SFDR values accurately.
ISBN:9781424472062
1424472067
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2010.5699273