Surface profilometry by digital holography

This paper presents newly developed method for measurement of surface topography based on frequency scanning digital holography. Digital holography allows for direct computation of the phase field of the wavefront scattered by an object. A tuning of the light source optical frequency results in line...

Full description

Saved in:
Bibliographic Details
Published in2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) pp. 1 - 5
Main Authors Psota, Pavel, Ledl, Vit, Kavan, Frantisek, Mokry, Pavel, Matousek, Ondrej
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.2017
Subjects
absolute measurement
digital holography
frequency scanning
Holographic optical components
Holography
Optical surface waves
Surface profilometry
Surface topography
Surface waves
Temperature measurement
Wavelength measurement
Online AccessGet full text

Cover

More Information
Summary:This paper presents newly developed method for measurement of surface topography based on frequency scanning digital holography. Digital holography allows for direct computation of the phase field of the wavefront scattered by an object. A tuning of the light source optical frequency results in linear phase variation with respect to the optical frequency. Slope of the linear function in every single pixel corresponds to absolute measurement of optical path difference and thus topography map of the surface can be retrieved. Principle of this contactless method is introduced and experimentally verified. The method can be used for measurement of complex geometries of common manufacturing parts as well as for topography measurement of complex composite structures, and active acoustic metasurfaces.
ISSN:1946-0759
DOI:10.1109/ETFA.2017.8247748