An on-die all-digital power supply noise analyzer with enhanced spectrum measurements

This paper presents a scalable all-digital power supply noise analyzer with 20GHz sampling bandwidth and 1mV resolution implemented in 32nm CMOS. This averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domain with low-resolution VCO-based samplers. For fre...

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Bibliographic Details
Published inESSCIRC 2014 - 40th European Solid State Circuits Conference (ESSCIRC) pp. 251 - 254
Main Authors Tzu-Chien Hsueh, O'Mahony, Frank, Mansuri, Mozhgan, Casper, Bryan K.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.2014
Subjects
autocorrelation
Clocks
Correlation
Delays
equivalent time
Frequency measurement
glitch free
Noise
Noise measurement
power delivery
Power measurement
random phase accumulation
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Summary:This paper presents a scalable all-digital power supply noise analyzer with 20GHz sampling bandwidth and 1mV resolution implemented in 32nm CMOS. This averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domain with low-resolution VCO-based samplers. For frequency-domain measurements, it uses digital random phase-noise accumulation to remove correlation between the power supply noise and sampling clocks. In addition, the equivalent-time current step response is measured on-die to characterize the frequency-domain impedance of the power delivery network.
ISBN:1479956945
9781479956944
ISSN:1930-8833
2643-1319
DOI:10.1109/ESSCIRC.2014.6942069