Decision tree based mismatch diagnosis in analog circuits

Mismatch is a critical consideration in analog circuit design. Knowledge of mismatch locations and an understanding of their impact on circuit performance are crucial for design optimization and process improvement. We present a circuit level mismatch diagnosis methodology in this paper. The functio...

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Bibliographic Details
Published in24th IEEE VLSI Test Symposium pp. 6 pp. - 285
Main Authors Mingjing Chen, Haggag, H., Orailoglu, A.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2006
Subjects
Analog circuits
Circuit optimization
Circuit simulation
Circuit testing
Decision trees
Degradation
Design automation
Design optimization
Fabrication
Predictive models
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Summary:Mismatch is a critical consideration in analog circuit design. Knowledge of mismatch locations and an understanding of their impact on circuit performance are crucial for design optimization and process improvement. We present a circuit level mismatch diagnosis methodology in this paper. The functional parameters with abnormal values are measured as manifestations of mismatch, from which reverse tracing is employed to determine the mismatch source. The methodology is implemented on a representative benchmark and its efficiency confirmed by simulation results
ISBN:9780769525143
0769525148
ISSN:1093-0167
2375-1053
DOI:10.1109/VTS.2006.26