APA (7th ed.) Citation

Ginez, O., Daga, J., Girard, P., Landrault, C., Pravossoudovitch, S., & Virazel, A. (2006). Embedded flash testing: Overview and perspectives. 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings, 210-215. https://doi.org/10.1109/DTIS.2006.1708721

Chicago Style (17th ed.) Citation

Ginez, O., J.-M Daga, P. Girard, C. Landrault, S. Pravossoudovitch, and A. Virazel. "Embedded Flash Testing: Overview and Perspectives." 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : Proceedings 2006: 210-215. https://doi.org/10.1109/DTIS.2006.1708721.

MLA (9th ed.) Citation

Ginez, O., et al. "Embedded Flash Testing: Overview and Perspectives." 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : Proceedings, 2006, pp. 210-215, https://doi.org/10.1109/DTIS.2006.1708721.