The investigation of measurement method for HPM radiation to the analog switch chip

In this paper we suggest a special measurement system using an optical transformation when an analog switch chip is exposed by an external High Power Microwave(HPM). The proposed measurement system can compare a normal operation with a malfunction of the chip, analyzed signals at each pin of the chi...

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Bibliographic Details
Published in2010 IEEE International Symposium on Electromagnetic Compatibility pp. 364 - 369
Main Authors Minkyun Yoo, Wonkyu Kim, Yoon-Mi Park, Min-Hyuk Kim, Young-Seek Chung, Hyun-Kyo Jung, Changyul Cheon
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2010
Subjects
Current measurement
Frequency measurement
Optical switches
Radio frequency
Semiconductor device measurement
Semiconductor lasers
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Summary:In this paper we suggest a special measurement system using an optical transformation when an analog switch chip is exposed by an external High Power Microwave(HPM). The proposed measurement system can compare a normal operation with a malfunction of the chip, analyzed signals at each pin of the chip when the HPM radiates to the chip. To analyze accurately the operation of the chip proposed measurement system uses an optical communication method. An electrical signal of the chip is modulated to an optical signal by a laser diode(LD) within the range of the HPM. After that, the modulated optical signal is demodulated to the electrical signal by a photo diode(PD) beyond the range of the HPM and then signal is measured. Because this system has no interference between frequency of microwaves and optical waves, an accurate analysis is possible.
ISBN:9781424463053
142446305X
ISSN:2158-110X
DOI:10.1109/ISEMC.2010.5711302