Characterization of aging process in power converters using spread spectrum time domain reflectometry

This paper aims to find a new technique to predict the state of health of power converters by characterizing the most vulnerable components in the converter without affecting the normal circuit operation. Spread spectrum time domain reflectometry (SSTDR) can detect most of the aged components inside...

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Bibliographic Details
Published in2012 IEEE Energy Conversion Congress and Exposition (ECCE) pp. 2142 - 2148
Main Authors Nasrin, M. S., Khan, F. H.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.2012
Subjects
Aging
Capacitors
Insulated gate bipolar transistors
MOSFETs
Resistance
Stress
Temperature measurement
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Summary:This paper aims to find a new technique to predict the state of health of power converters by characterizing the most vulnerable components in the converter without affecting the normal circuit operation. Spread spectrum time domain reflectometry (SSTDR) can detect most of the aged components inside the converter while the converter is operational. Semiconductor switches and electrolytic capacitors are the two most sensitive components in power converter circuits, and this paper demonstrated how SSTDR can be used to determine the degradation of these components. Multiple sets of test data have been generated while the SSTDR process is applied to the power MOSFETs, IGBTs connected in a chopper circuit and to the aluminum electrolytic capacitors connected in an RC circuit. Analysis is done on these obtained test data to show how the SSTDR generated data are consistent with the aging of power MOSFETs, IGBTs and electrolytic capacitors.
ISBN:1467308021
9781467308021
ISSN:2329-3721
2329-3748
DOI:10.1109/ECCE.2012.6342450