An LWIR imaging system with low noise characteristic based on CMOS TDI detector

In the interest of expanding our observation of long wavelength spectral range based on space, we have designed and implemented a CMOS LWIR Imaging system by using time delay and integration (TDI) arrays with a 480 line of 6 stages. In the hardware design we pay much emphasis on how to reduce noise...

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Bibliographic Details
Published inIEEE 10th INTERNATIONAL CONFERENCE ON SIGNAL PROCESSING PROCEEDINGS pp. 413 - 416
Main Authors Baorong Xie, Longcheng Zhao, Yutian Fu
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2010
Subjects
CMOS integrated circuits
CMOS TDI
Converters
Detectors
Imaging
Imaging system
LWIR
NETD
Noise
non-uinfomity correction
Pixel
Software
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Summary:In the interest of expanding our observation of long wavelength spectral range based on space, we have designed and implemented a CMOS LWIR Imaging system by using time delay and integration (TDI) arrays with a 480 line of 6 stages. In the hardware design we pay much emphasis on how to reduce noise and improve signal to noise ratio (SNR) of infrared system. The software of host computer realizes non-uniformity correction of line-scan images. This paper presents each part of the system design in detail and preliminary results of tests and imaging. Experiments show that the long wavelength infrared CMOS TDI imaging system has a good performance in terms of SNR and images uniformity.
ISBN:9781424458974
1424458978
ISSN:2164-5221
DOI:10.1109/ICOSP.2010.5657159