SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET

• Published in: 2019 IEEE International Reliability Physics Symposium (IRPS) pp. 1 - 6
• Main Authors: Uemura, Taiki, Lee, Soonyoung, Min, Dahye, Moon, Ihlhwa, Lee, Seungbae, Pae, Sangwoo
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.03.2019
• Subjects: alpha; Bars; Delays; FinFETs; mitigation technique; Neutrons; proton; Protons; Radiation effects; single event transient; single event upset; Single event upsets; soft error

This paper proposes soft error immune flip-flop (SEIFF) for mitigating single event upset (SEU) in flip-flops (FFs) and impact of single event transient (SET) in combinational-logic. SEIFF mitigates the SET without enlarging setup-time and delay; there is no overhead in circuit performance. Alpha an...