SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET

This paper proposes soft error immune flip-flop (SEIFF) for mitigating single event upset (SEU) in flip-flops (FFs) and impact of single event transient (SET) in combinational-logic. SEIFF mitigates the SET without enlarging setup-time and delay; there is no overhead in circuit performance. Alpha an...

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Bibliographic Details
Published in2019 IEEE International Reliability Physics Symposium (IRPS) pp. 1 - 6
Main Authors Uemura, Taiki, Lee, Soonyoung, Min, Dahye, Moon, Ihlhwa, Lee, Seungbae, Pae, Sangwoo
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.03.2019
Subjects
alpha
Bars
Delays
FinFETs
mitigation technique
Neutrons
proton
Protons
Radiation effects
single event transient
single event upset
Single event upsets
soft error
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Summary:This paper proposes soft error immune flip-flop (SEIFF) for mitigating single event upset (SEU) in flip-flops (FFs) and impact of single event transient (SET) in combinational-logic. SEIFF mitigates the SET without enlarging setup-time and delay; there is no overhead in circuit performance. Alpha and proton tests validate the mitigation efficiency in SEIFF manufactured on 10 nm FinFET technology.
ISSN:1938-1891
DOI:10.1109/IRPS.2019.8720513