Auto-focusing system for microscope based on computational verb controllers
In this paper, an auto-focusing system of microscope for integrated circuits (IC) analysis is presented. In this system, the Laplacian algorithm is used as the evaluation function, which provides a reference to the degree of defocus. The auto-focusing controlling algorithm based on computational ver...
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Published in | 2008 2nd International Conference on Anti-counterfeiting, Security and Identification pp. 84 - 87 |
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Main Authors | , , , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.08.2008
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Subjects | |
Online Access | Get full text |
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Summary: | In this paper, an auto-focusing system of microscope for integrated circuits (IC) analysis is presented. In this system, the Laplacian algorithm is used as the evaluation function, which provides a reference to the degree of defocus. The auto-focusing controlling algorithm based on computational verb theory consists of two controllers designed: the moving-speed controller and the moving-direction controller. Both controllers work well under the verb-control rules designed in this paper. It has shown that the system can focus accurately and quickly, and it can adjust itself when it is out of focus. |
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ISBN: | 9781424425846 1424425840 |
ISSN: | 2163-5048 2163-5056 |
DOI: | 10.1109/IWASID.2008.4688356 |