Auto-focusing system for microscope based on computational verb controllers

In this paper, an auto-focusing system of microscope for integrated circuits (IC) analysis is presented. In this system, the Laplacian algorithm is used as the evaluation function, which provides a reference to the degree of defocus. The auto-focusing controlling algorithm based on computational ver...

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Bibliographic Details
Published in2008 2nd International Conference on Anti-counterfeiting, Security and Identification pp. 84 - 87
Main Authors Weibin Tang, Yinghao Liao, Zhicong Chen, Lihuan Cai, Tao Yang, Donghui Guo
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.08.2008
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Summary:In this paper, an auto-focusing system of microscope for integrated circuits (IC) analysis is presented. In this system, the Laplacian algorithm is used as the evaluation function, which provides a reference to the degree of defocus. The auto-focusing controlling algorithm based on computational verb theory consists of two controllers designed: the moving-speed controller and the moving-direction controller. Both controllers work well under the verb-control rules designed in this paper. It has shown that the system can focus accurately and quickly, and it can adjust itself when it is out of focus.
ISBN:9781424425846
1424425840
ISSN:2163-5048
2163-5056
DOI:10.1109/IWASID.2008.4688356