Novel Measurement Set-Ups of FTB Stress Propagation in an IC

EMC tests are performed on an integrated circuit in order to verify that it is not disturbed or does not disturb other entities. This paper is focused on FTB tests, which are inspired from the IEC 61000-4-4 standard, but applied on IC (i.e., MCU). Collecting information on the power network frequenc...

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Bibliographic Details
Published in2018 Progress in Electromagnetics Research Symposium (PIERS-Toyama) pp. 513 - 519
Main Authors Bacher, Y., Quazzo, L., Braquet, H., Froidevaux, N., Jacquemod, G.
Format Conference Proceeding
LanguageEnglish
Published The Institute of Electronics, Information and Communication Engineers (IEICE) 01.08.2018
Subjects
Frequency measurement
Microcontrollers
Resonant frequency
Semiconductor device measurement
Stress
TEM cells
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Summary:EMC tests are performed on an integrated circuit in order to verify that it is not disturbed or does not disturb other entities. This paper is focused on FTB tests, which are inspired from the IEC 61000-4-4 standard, but applied on IC (i.e., MCU). Collecting information on the power network frequency response could be a huge help for debugging purpose. Indeed, the PDN was identified to be the main contributor in the FTB test results. Unfortunately during an FTB stress, no measurement is possible due to electromagnetic disturbance. Indeed, coupling on probe cable disturbs measurements when performed during the stress. In order to overcome this problem, two novel measurement methods have been developed: Global resonance analysis method and Local resonance analysis method. Finally, some solutions to increase the FTB robustness of the MCU are proposed and validated.
ISSN:2694-5053
DOI:10.23919/PIERS.2018.8598206