Cross Talk Coupling, a Tool to Characterize Electromagnetic Immunity of Integrated Circuits

The paper deals with use of cross talk coupling throughout transmission lines in order to determine electromagnetic sensitivity of integrated circuits. Some experimental data will be proposed to point out the relationship between occurrence of the resonance on the line and non linear effects due to...

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Bibliographic Details
Published in2006 1st Electronic Systemintegration Technology Conference Vol. 1; pp. 233 - 240
Main Authors Bazzoli, S., Ben Slimen, N., Kone, L., Demoulin, B.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.2006
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Summary:The paper deals with use of cross talk coupling throughout transmission lines in order to determine electromagnetic sensitivity of integrated circuits. Some experimental data will be proposed to point out the relationship between occurrence of the resonance on the line and non linear effects due to ESD clamping diode placed at IC's input. To conclude some details are brought to extend cross talk data to the general case of the lines under plane wave radiation
ISBN:1424405521
9781424405527
DOI:10.1109/ESTC.2006.280003