A path sensitization technique for testing of switched capacitor circuits

In this work, we describe a new method for testing of switched capacitor (SC) circuits, based on modeling the circuit as a charge transfer graph. Based on the differences between the graphs of good and faulty circuits, one or more paths are identified such that upon their sensitization the differenc...

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Bibliographic Details
Published in16th International Conference on VLSI Design, 2003. Proceedings pp. 30 - 35
Main Authors Biswas, S., Mazhari, B.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2003
Subjects
Analog circuits
Charge transfer
Circuit faults
Circuit testing
Clocks
Digital circuits
Filters
Switched capacitor circuits
Switching circuits
Voltage
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Summary:In this work, we describe a new method for testing of switched capacitor (SC) circuits, based on modeling the circuit as a charge transfer graph. Based on the differences between the graphs of good and faulty circuits, one or more paths are identified such that upon their sensitization the difference in output voltage of the good and faulty circuits becomes appreciable. The validity of the proposed technique is demonstrated using the examples of SC lossy integrator, voltage amplifier and biquad filter circuits. It is shown that the proposed technique is efficient in testing both catastrophic as well as parametric faults in the capacitors.
ISBN:0769518680
9780769518688
ISSN:1063-9667
2380-6923
DOI:10.1109/ICVD.2003.1183111