Tracking of Aging Processes in Power Electronic Converters Using the Rainflow Method

The analysis of power cycling in semiconductor modules is often based on a normalized lifetime consumption or cumulative damage models added up via Miner's rule. Although this is a widely accepted method to estimate a predicted lifetime it is not possible to overlay those results with other wea...

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Bibliographic Details
Published inIECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society pp. 3687 - 3692
Main Authors Kitzler, Stefan, Stockl, Johannes, Kupzog, Friederich, Miletic, Zoran
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2018
Subjects
Aging
computational modeling
Degradation
Fatigue
Hysteresis
insulated gate bipolar transistors
Power electronics
Predictive models
Reliability
thermal stresses
Time series analysis
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Summary:The analysis of power cycling in semiconductor modules is often based on a normalized lifetime consumption or cumulative damage models added up via Miner's rule. Although this is a widely accepted method to estimate a predicted lifetime it is not possible to overlay those results with other wear-out mechanisms caused by aging degradation progress in time. The paper describes a method to derive a reasonable aging model based on typical power cycling data provided by industry.
ISSN:2577-1647
DOI:10.1109/IECON.2018.8592815