Refractive index evaluation of multi-walled carbon nanotube arrays

Transmission terahertz time-domain spectroscopy (THz-TDS) measurements of carbon nanotube arrays are presented. A relatively thin film with vertically aligned multi-walled carbon nanotubes has been prepared and measured using THz-TDS. Experimental results were obtained from 80GHz to 2.5THz, and the...

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Bibliographic Details
Published inProceedings of the Fourth European Conference on Antennas and Propagation pp. 1 - 3
Main Authors Katsounaros, A, Rajab, K Z, Hou, K, Mann, M, Naftaly, M, Collings, N, Crossland, W A, Hao, Y
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.04.2010
Subjects
Carbon nanotubes
Geometry
Plasma properties
Plasma temperature
Pulse measurements
Refractive index
Semiconductor films
Silicon
Sputtering
Substrates
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Summary:Transmission terahertz time-domain spectroscopy (THz-TDS) measurements of carbon nanotube arrays are presented. A relatively thin film with vertically aligned multi-walled carbon nanotubes has been prepared and measured using THz-TDS. Experimental results were obtained from 80GHz to 2.5THz, and the sample has been characterized by extracting the relative permittivity of the carbon nanotubes. A combination of the Maxwell-Garnett and Drude models within the frequency range provide a good fit to the measured permittivity.
ISBN:9781424464319
1424464315
ISSN:2164-3342