An Active Pixel CMOS separable transform image sensor

This paper presents a 128 times 128 charge-mode CMOS imaging sensor that computes separable transforms directly on the focal plane. The pixel is a unique extension of the widely reported active pixel sensor (APS) cell. By capacitively coupling across an array of such cells onto switched capacitor ci...

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Bibliographic Details
Published in2009 IEEE International Symposium on Circuits and Systems (ISCAS) pp. 1281 - 1284
Main Authors Chi, Y.M., Abbas, A., Chakrabartty, S., Cauwenberghs, G.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.05.2009
Subjects
Charge-coupled image sensors
CMOS image sensors
Coupling circuits
Image resolution
Image sensors
Noise reduction
Pixel
Sampling methods
Switched capacitor circuits
Voltage
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ISBN1424438276
9781424438273
ISSN0271-4302
DOI10.1109/ISCAS.2009.5117997

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Summary:This paper presents a 128 times 128 charge-mode CMOS imaging sensor that computes separable transforms directly on the focal plane. The pixel is a unique extension of the widely reported active pixel sensor (APS) cell. By capacitively coupling across an array of such cells onto switched capacitor circuits, computation of any unitary 2-D transform that is separable into inner and outer products is possible. This includes the Walsh, Hadamard and Haar basis functions. This scheme offers several advantages including multiresolution imaging, inherent de-noising, compressive sampling and lower integration voltage and faster readout. The chip was implemented on a 0.5 mum CMOS process and measures 9 mm 2 in MOSIS' submicron design rules.
ISBN:1424438276
9781424438273
ISSN:0271-4302
DOI:10.1109/ISCAS.2009.5117997